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This is an atomic force microscope system capable of imaging multiple physical properties of sample material at the nanoscale level.
The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample.
Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.
- Capable of imaging multiple physical properties of a sample material at the nanoscale level with a minimum amount of alteration to the system, thereby saving valuable time and equipment costs
- Businesses can commercialize the technology by licensing U.S. Patent 8,726,410 from the Air Force