Air Force

Atomic force microscopy for nanoscale measurement

Scanning microscopy for imaging properties using currents induced within the sample material

Sensors

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This is an atomic force microscope system capable of imaging multiple physical properties of sample material at the nanoscale level.

The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample.

Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.

Prenegotiated License Terms

Non-Exclusive
Partially Exclusive
Exclusive
License Execution Fee
$1,000
$1,500
$2,500
Royalty on Gross Sales
2%
3%
4%
Minimum Annual Royalty
$1,000
$1,500
$2,500
Sublicensing Passthrough Royalty
N/A
50%
50%
Annual Patent Fee
$1,000
$1,500
$1,500

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