Apply online to license this technology
Photonics packaging research at the Naval Air Warfare Center in Patuxent River, Maryland, is enabling fiber optic transceivers with built-in test (BIT) capability such that fiber optic transceivers can detect optical faults and power loss, improving the reliability and maintenance of fiber optic local area networks (LANs) used in avionics, data centers, and office buildings.
Previous methods to find faults in fiber optic cables did not allow vertical cavity surface emitting or edge emitting laser power monitoring in conjunction with in situ optical time domain reflectometry (OTDR) to isolate faults down to the fiber optic transmitter, receiver, and cable plant level.
The following inventions address these issues. An optical bench fiber optic transmitter (US patent 7,853,144), emits a light signal through an angled fiber facet, whereby a portion of the laser signal illuminates the photodetector and a portion illuminates the fibers being monitored. A fiber optic optical subassembly configuration for monitoring fibers (US patent 7,714,991) emits a signal through a beam splitter whereby a portion illuminates the photodetector and a portion is sent down a fiber and reflects from the end of a fiber to transmit light into the fiber being monitored. An optical subassembly package configuration with BIT capability for monitoring a single fiber was also invented (US patent 8,023,784).
- Enables built in testing of optical fiber cables and fiber optic transceivers, including fiber optic link fault detection and isolation
- Improves fiber optic link and LAN performance monitoring for LANs used in an aircraft, ships, space and terrestrial platforms
- Can be used with any fiber optic transmitter or transceiver package configuration or optical subassembly configuration
- May be used in commercial, military and aerospace fiber optic systems
- Ongoing development via AFRL and NAVSEA SBIR Projects
- Three issued US patents available for license: 7,853,144; 7,714,991; and 8,023,784
- Peer reviewed papers available