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Multi-fragment impact test specimen

  • US Patent No. 6945088
  • Issued: September 20, 2005
  • Status: Expired
Sensors

A multiple fragment impact test specimen, and a method for using it in multiple fragment impact tests against a target, is disclosed. The test specimen comprises two or more fragments fixed to one or more connecting members so that the fragments are held at a fixed distance apart during their flight to a target. The orientation and speed of the fragments at the moment of impacting the target are measured and the measurements are used to calculate the exact spacing and time delay between the individual fragment impacts. An experimenter can control the range of fragment spacings and time delays for a series of tests by choosing the lengths of the connecting members and thereby fixing the relative distances between the fragments.

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